9031 4100 00
9031410000
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
- Reference date
- 2026-10-11
- Last TARIC file date
- 2026-10-08
Pick an origin
Union measures depend on origin. This page does not present a duty as if origin were unnecessary. Erga Omnes is not a typed origin.